Paper Info
Title
Nanoscale Investigations Of Optical Fiber By Using Scattering Scanning Near-Field Optical Microscopy
Abstract
Scattering Scanning Near-field Optical Microscopy (s-SNOM) is proposed as a powerful tool for quantitative analysis of cross-sectional area of optical fibers. The s-SNOM images are processed pixel-by-pixel in order to map the refractive index of the optical fibers' cross-sectional surface. s-SNOM imaging technique is widely known for its capability to reach nanoscale resolution, therefore the obtained maps of refractive index based on s-SNOM data are as well characterized by nanoscale resolution. Combined with Atomic Force Microscopy (AFM) images simultaneously acquired with s-SNOM, this technique proves to be a powerful tool not only for characterization of refractive index profile of optical fibers, but also for quality check of optical fibers (or other types of optical waveguides) at nanoscale. Particularly, in this study we prove the capability of s-SNOM to map the refractive index of cross-sectional area of a Panda-style polarization-maintaining single mode optical fiber.
Year
DOI
Venue
2018
10.1109/ICTON.2018.8473744
2018 20TH ANNIVERSARY INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS (ICTON)
Keywords
DocType
ISSN
optical imaging, laser scanning, near-field optical microscopy, refractive index map
Conference
2162-7339
Citations 
PageRank 
References 
0
0.34
0
Authors
6
Name
Order
Citations
PageRank
denis e tranca154.19
Catalin Stoichita201.35
radu hristu304.39
stefan g stanciu456.90
Charles V. Sammut501.35
g a stanciu603.72