Name
Title | ||
|---|---|---|
A Bayesian framework to estimate part quality and associated uncertainties in multistage manufacturing. |
Abstract | ||
|---|---|---|
•Uncertainty contributors in multistage manufacturing processes are discussed.•A metrology informatics system for multistage manufacturing processes is presented.•A probabilistic model based on Bayesian linear regression is developed.•The prediction results are analysed from both Bayesian and frequentist viewpoints.•The proposed solution can avoid screening inspection with independent measurements. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1016/j.compind.2018.10.008 | Computers in Industry |
Keywords | Field | DocType |
Multistage Manufacturing Process (MMP),Bayesian inference,Regression,ANOVA,Metrology informatics,Measurement uncertainty | Flatness (systems theory),Informatics,Predictive analytics,Metrology,Bayesian linear regression,Control engineering,Machining,Statistical model,Engineering,Bayesian probability | Journal |
Volume | ISSN | Citations |
105 | 0166-3615 | 1 |
PageRank | References | Authors |
0.40 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Moschos Papananias | 1 | 1 | 0.40 |
| Thomas E. McLeay | 2 | 1 | 0.40 |
| Mahdi Mahfouf | 3 | 235 | 33.17 |
| Visakan Kadirkamanathan | 4 | 431 | 62.00 |