Title
On Optimal Power-Aware Path Sensitization
Abstract
Detailed knowledge of a circuit's timing is essential for performance optimization, timing closure, and generation of test patterns to detect small-delay defects. When an input transition is applied to the circuit's inputs, the resulting delay is not only determined by the propagation path, but also influenced by the power-supply noise. We introduce a path-sensitization procedure which precisely controls the switching activity in the circuit region surrounding the path. The procedure can maximize or minimize switching activity, or set it to a user-specified value. We study the accuracy-vs.-efficiency trade-offs for a hierarchy of timing models, from coarse zero-delay assumption to a waveform-accurate approach with sub-cycle resolution. For the first time, we present a MaxSAT formulation which guarantees maximization or minimization of switching activity, stemming from transitions and from glitches, simultaneously with path sensitization. We validate the quality of the generated test patterns using a mixed-mode IR-drop-aware timing simulator.
Year
DOI
Venue
2016
10.1109/ATS.2016.63
2016 IEEE 25th Asian Test Symposium (ATS)
Keywords
Field
DocType
ATPG,low power,sensitizable path,formal methods,optimization
Maximum satisfiability problem,Automatic test pattern generation,Glitch,Logic gate,Computer science,Algorithm,Electronic engineering,Real-time computing,Static timing analysis,Minification,Maximization,Timing closure
Conference
ISSN
ISBN
Citations 
1081-7735
978-1-5090-3810-7
0
PageRank 
References 
Authors
0.34
21
7
Name
Order
Citations
PageRank
Matthias Sauer119520.02
Jie Jiang2191.76
sven reimer3454.48
Kohei Miyase456238.71
Xiaoqing Wen579077.12
B. Becker619121.44
Ilia Polian788978.66