Title
Impact of time bound constraints and batching on metallization in an opto-semiconductor fab.
Abstract
Time bound sequences are constraints deemed necessary to ensure product quality and avoid yield loss due to time dependent effects. Although they are commonly applied in production system control they cause severe logistical challenges. In this paper, we evaluate the effects of time constraints in combination with batching on a real metallization work center of an opto-semiconductor fab. We use simulation to analyze the impact of these production constraints and point out potentials to increase work center performance. We have a closer look at the required planning horizon, the influence of dedication, the capacity loss due to time bounds and the effects of batching strategies on wafer cost. Our results show the importance to tackle these issues. Furthermore, we will discuss actions taken in response to the experiments.
Year
DOI
Venue
2016
10.1109/WSC.2016.7822329
Winter Simulation Conference
Field
DocType
ISSN
Data modeling,Wafer,Ensure (product),Time horizon,Capacity loss,Simulation,Semiconductor device modeling,Computer science,Semiconductor fab,Control system
Conference
0891-7736
ISBN
Citations 
PageRank 
978-1-5090-4484-9
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Falk Stefan Pappert142.18
Tao Zhang223.12
Oliver Rose31710.43
Fabian Suhrke400.68
Jonas Mager500.68
Thomas Frey600.34