Paper Info
Title
Morphology-Retained Non-Linear Image Registration Of Serial Electron Microscopy Sections
Abstract
Image registration of serial electron microscopy (EM) sections is a feasible way to reveal 3D structure of the biological tissue. However, the image registration proves difficult, as it is hard to find reliable correspondences between the adjacent sections and the section distortion may occur during the sample preparation. In this paper, we propose a non-linear image registration method for serial EM sections, which is composed of pairwise correspondences extraction, correspondences position adjustment and image warping. The proposed method is highly automatic, and retains the morphology of the original electron microscopic images as much as possible. We demonstrate that our method outperforms the state-of-the-art approaches on several datasets of serial EM sections images including a synthetic test case.
Year
Venue
Keywords
2018
2018 25TH IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP)
Image registration, serial sections, correspondence extraction
Field
DocType
ISSN
Iterative reconstruction,Computer vision,Nonlinear system,Image warping,Pattern recognition,Computer science,Electron microscope,Biological tissue,Artificial intelligence,Distortion,Image registration
Conference
1522-4880
Citations 
PageRank 
References 
0
0.34
0
Authors
4
Name
Order
Citations
PageRank
Xi Chen1116.77
Qiwei Xie27616.03
Lijun Shen312.05
Hua Han421.77