Paper Info
Title
Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules.
Abstract
The reliability of solar photovoltaic (PV) panels is significantly affected by the formation of hotspots in active operation. In this paper, hotspots are analyzed in conventional crystalline-silicon (c-Si) and emerging thin-film (TF) Copper Indium Selenide (CIS) PV modules, along with the investigation of the shading effects on their performance. Both module technologies behave differently in varying shade scenarios with the CIS TF panel technology showing superior results in terms of hotspots and the power output. The better performance in CIS TF is attributed to its monolithic panel architecture, which allows better redistribution of the voltages and currents within the module. It was observed that, for a typical module, the overall shadow-induced reverse temperature is lower in CIS TF modules. This paper therefore provides useful insights for PV system planning and operation for regions with high average temperatures along with potential issues due to partial shadings.
Year
DOI
Venue
2018
10.1016/j.microrel.2018.06.097
MICROELECTRONICS RELIABILITY
Keywords
Field
DocType
Partial shade,Hotspots,Thin-film panels,Crystalline-silicon modules,Thermographic analysis
Engineering physics,Indium,Selenide,Hotspot (geology),Voltage,Electronic engineering,Crystalline silicon,Engineering,Thin film,Photovoltaic system
Journal
Volume
ISSN
Citations 
88-90
0026-2714
0
PageRank 
References 
Authors
0.34
3
4
Name
Order
Citations
PageRank
S. Ahsan100.34
K. Niazi200.34
Hassan Khan322.87
Yongheng Yang43015.47