Name
Title | ||
|---|---|---|
Improving the scan rate and image quality in tapping Mode Atomic Force Microscopy with piezoelectric shunt control |
Year | Keywords | Field |
|---|---|---|
2011 | oscillations,electrical impedance,shunt electrical,force,transfer function,cantilevers,surfaces,image quality,impedance,transfer functions,atomic force microscopy,q factor,oscillators | Q factor,Shunt (electrical),Horizontal scan rate,Cantilever,Image quality,Electronic engineering,Electrical impedance,Non-contact atomic force microscopy,Optoelectronics,Materials science,Piezoelectricity |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
4 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Fairbairn, M.W. | 1 | 2 | 1.06 |
| S. O. Reza Moheimani | 2 | 25 | 7.64 |
| A. J. Fleming | 3 | 9 | 4.75 |