Title
SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems.
Abstract
Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different layers of the system is a very complex task that requires the support of dedicated frameworks for cross-layer reliability analysis. This paper proposes SyRA, a system-level cross-l...
Year
DOI
Venue
2019
10.1109/TC.2018.2887225
IEEE Transactions on Computers
Keywords
Field
DocType
Bayes methods,Software reliability,Hardware,Microprocessors,Resilience,Complexity theory
Psychological resilience,Cross layer,x86,Bayesian inference,Computer science,Microprocessor,Exploit,Real-time computing,Software,Software quality,Computer engineering
Journal
Volume
Issue
ISSN
68
5
0018-9340
Citations 
PageRank 
References 
8
0.92
0
Authors
14