Paper Info
Title
An ultra-low voltage chaos-based true random number generator for IoT applications
Abstract
Low-power consumption and low-voltage operation are critical enabling features for Internet of Things (IoT) devices that are powered from energy harvesting. This paper presents a chaos-based true random number generator (TRNG) that can operate at an ultra-low voltage (ULV) and be integrated into energy-constrained IoT devices for secure communications. Folded Bernoulli maps are adopted for random number generation. Switched-capacitor chaotic circuits utilize bulk-driven amplifiers to mitigate gate leakage issue, two-stage comparators to increase voltage headroom, and low-complexity calibration schemes to ensure robustness. This system covers a wide range of process and temperature variations while consuming 142 nW from a 0.4 V supply at a bit rate of 10 kb/s. The generated bits pass National Institute of Standards and Technology (NIST) Pub-800.22 randomness tests successfully.
Year
DOI
Venue
2019
10.1016/j.mejo.2019.03.013
Microelectronics Journal
Keywords
Field
DocType
Chaotic map,Cryptography,Encryption,Security,True random number generators (TRNGs),Ultra-low voltage (ULV)
Energy harvesting,Electronic engineering,Robustness (computer science),NIST,Headroom (audio signal processing),Randomness tests,Low voltage,Engineering,Random number generation,Electronic circuit
Journal
Volume
ISSN
Citations 
87
0026-2692
0
PageRank 
References 
Authors
0.34
0
2
Name
Order
Citations
PageRank
Jen-Chieh Hsueh100.34
Chen, V.H.-C.252.66