Title
Spying on Temperature using DRAM
Abstract
Today's ubiquitous IoT devices make spying on, and collecting data from, unsuspecting users possible. This paper shows a new attack where DRAM modules, widely used in IoT devices, can be abused to measure the temperature in the vicinity of the device in order to spy on a user's behavior. Specifically, the temperature dependency of the DRAM decay is used as a proxy for user's behavior in the vicinity of the device. The attack can be performed remotely by only changing the software of an IoT device, without requiring hardware changes, and with a resolution reaching 0.5°C. Potential defenses to the temperature spying attack are presented in this paper as well.
Year
DOI
Venue
2019
10.23919/DATE.2019.8714882
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Keywords
Field
DocType
Security,IoT,DRAM,Temperature
Dram,Computer science,Parallel computing,Operating system
Conference
ISSN
ISBN
Citations 
1530-1591
978-1-7281-0331-0
0
PageRank 
References 
Authors
0.34
6
5
Name
Order
Citations
PageRank
Wenjie Xiong1299.94
Nikolaos Anagnostopoulos2229.61
André Schaller3285.32
Stefan Katzenbeisser41844143.68
Jakub Szefer539837.00