Title
NV-BNN: An Accurate Deep Convolutional Neural Network Based on Binary STT-MRAM for Adaptive AI Edge
Abstract
Binary STT-MRAM is a highly anticipated embedded nonvolatile memory technology in advanced logic nodes < 28 nm. How to enable its in-memory computing (IMC) capability is critical for enhancing AI Edge. Based on the soon-available STT-MRAM, we report the first binary deep convolutional neural network (NV-BNN) capable of both local and remote learning. Exploiting intrinsic cumulative switching probability, accurate online training of CIFAR-10 color images (~ 90%) is realized using a relaxed endurance spec (switching ≤ 20 times) and hybrid digital/IMC design. For offline training, the accuracy loss due to imprecise weight placement can be mitigated using a rapid non-iterative training-with-noise and fine-tuning scheme.
Year
DOI
Venue
2019
10.1145/3316781.3317872
Proceedings of the 56th Annual Design Automation Conference 2019
Keywords
Field
DocType
binary STT-MRAM,adaptive AI Edge,nonvolatile memory technology,advanced logic nodes,in-memory computing capability,binary deep convolutional neural network,NV-BNN,STT-MRAM,cumulative switching probability,remote learning,local learning
Computer science,Convolutional neural network,Electronic engineering,Magnetoresistive random-access memory,Remote learning,Spec#,Computer engineering,Binary number
Conference
ISSN
ISBN
Citations 
0738-100X
978-1-4503-6725-7
1
PageRank 
References 
Authors
0.48
5
11
Name
Order
Citations
PageRank
Chih-Cheng Chang1202.77
Ming-Hung Wu221.23
Jia-Wei Lin3154.49
Chun-Hsien Li411.16
vivek parmar585.42
Heng-Yuan Lee622820.66
Jeng-Hua Wei710.82
Shyh-Shyuan Sheu821123.45
manan suri9107.84
Tian-Sheuan Chang1071269.10
Tuo-Hung Hou11234.92