Title | ||
---|---|---|
Evaluation of Single Event Effects in SRAM and RRAM Based Neuromorphic Computing System for Inference |
Abstract | ||
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In this work, single event effects (SEEs) are analyzed in SRAM- and RRAM-based neuromorphic computing systems. SPICE simulation is employed to model single event upset (SEU) at the array level. Then SEU effects are mapped to the weight pattern change of a multi-layer perceptron (MLP), a representative artificial neural network for MNIST handwritten digit recognition. Simulations show that the RRAM-based MLP has less susceptibility to SEEs compared with the SRAM architecture. Improvements to the SRAM-based MLP reliability may be achieved by lowering bit-width and enlarging network size. |
Year | DOI | Venue |
---|---|---|
2019 | 10.1109/IRPS.2019.8720490 | 2019 IEEE International Reliability Physics Symposium (IRPS) |
Keywords | Field | DocType |
single event upset,SRAM,RRAM,neuromorphic computing,multi-layer perceptron | Computer architecture,Inference,Neuromorphic engineering,Electronic engineering,Static random-access memory,Engineering,Resistive random-access memory | Conference |
ISSN | ISBN | Citations |
1541-7026 | 978-1-5386-9504-3 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Zhilu Ye | 1 | 0 | 0.34 |
Rui Liu | 2 | 47 | 5.32 |
Hugh J. Barnaby | 3 | 26 | 7.17 |
Shimeng Yu | 4 | 490 | 56.22 |