Title
Evaluation of Single Event Effects in SRAM and RRAM Based Neuromorphic Computing System for Inference
Abstract
In this work, single event effects (SEEs) are analyzed in SRAM- and RRAM-based neuromorphic computing systems. SPICE simulation is employed to model single event upset (SEU) at the array level. Then SEU effects are mapped to the weight pattern change of a multi-layer perceptron (MLP), a representative artificial neural network for MNIST handwritten digit recognition. Simulations show that the RRAM-based MLP has less susceptibility to SEEs compared with the SRAM architecture. Improvements to the SRAM-based MLP reliability may be achieved by lowering bit-width and enlarging network size.
Year
DOI
Venue
2019
10.1109/IRPS.2019.8720490
2019 IEEE International Reliability Physics Symposium (IRPS)
Keywords
Field
DocType
single event upset,SRAM,RRAM,neuromorphic computing,multi-layer perceptron
Computer architecture,Inference,Neuromorphic engineering,Electronic engineering,Static random-access memory,Engineering,Resistive random-access memory
Conference
ISSN
ISBN
Citations 
1541-7026
978-1-5386-9504-3
0
PageRank 
References 
Authors
0.34
0
4
Name
Order
Citations
PageRank
Zhilu Ye100.34
Rui Liu2475.32
Hugh J. Barnaby3267.17
Shimeng Yu449056.22