Title
An Approach to T-Way Test Sequence Generation With Constraints
Abstract
In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t-way sequence testing practically useful.
Year
DOI
Venue
2019
10.1109/ICSTW.2019.00059
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Keywords
Field
DocType
Sequential analysis,Protocols,Syntactics,Semantics,Test pattern generators,Conferences
Notation,Programming language,Computer science,Test sequence,Test pattern generators,Semantics,Communications protocol
Conference
ISSN
ISBN
Citations 
2159-4848
978-1-7281-0888-9
0
PageRank 
References 
Authors
0.34
0
4
Name
Order
Citations
PageRank
Feng Duan1344.43
Yu Lei267644.45
Raghu N. Kacker315817.99
D. Richard Kuhn42723203.24