Title
A Multiple Fault Localization Approach Based on Multicriteria Analytical Hierarchy Process
Abstract
Fault localization problem is one of the most difficult processes in software debugging. Several spectrum-based ranking metrics have been proposed and none is shown to be empirically optimal. In this paper, we consider the fault localization problem as a multicriteria decision making problem. The proposed approach tackles the different metrics by aggregating them into a single metric using a weighted linear formulation. A learning step is used to maintain the right expected weights of criteria. This approach is based on Analytic Hierarchy Process (AHP), where a ranking is given to a statement in terms of suspiciousness according to a comparison of ranks given by the different metrics. Experiments performed on standard benchmark programs show that our approach enables to propose a more precise localization than existing spectrum-based metrics.
Year
DOI
Venue
2019
10.1109/AITest.2019.00-16
2019 IEEE International Conference On Artificial Intelligence Testing (AITest)
Keywords
Field
DocType
Fault Localization,Spectrum-based Fault Localization,Multiple Fault,Multicriteria Decision Making,AHP
Data mining,Ranking,Software debugging,Computer science,Analytic hierarchy process
Conference
ISBN
Citations 
PageRank 
978-1-7281-0493-5
0
0.34
References 
Authors
0
5
Name
Order
Citations
PageRank
Noureddine Aribi102.37
Nadjib Lazaar23612.25
Yahia Lebbah311519.34
Samir Loudni415221.48
mehdi maamar531.40