Title | ||
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A Multiple Fault Localization Approach Based on Multicriteria Analytical Hierarchy Process |
Abstract | ||
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Fault localization problem is one of the most difficult processes in software debugging. Several spectrum-based ranking metrics have been proposed and none is shown to be empirically optimal. In this paper, we consider the fault localization problem as a multicriteria decision making problem. The proposed approach tackles the different metrics by aggregating them into a single metric using a weighted linear formulation. A learning step is used to maintain the right expected weights of criteria. This approach is based on Analytic Hierarchy Process (AHP), where a ranking is given to a statement in terms of suspiciousness according to a comparison of ranks given by the different metrics. Experiments performed on standard benchmark programs show that our approach enables to propose a more precise localization than existing spectrum-based metrics. |
Year | DOI | Venue |
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2019 | 10.1109/AITest.2019.00-16 | 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) |
Keywords | Field | DocType |
Fault Localization,Spectrum-based Fault Localization,Multiple Fault,Multicriteria Decision Making,AHP | Data mining,Ranking,Software debugging,Computer science,Analytic hierarchy process | Conference |
ISBN | Citations | PageRank |
978-1-7281-0493-5 | 0 | 0.34 |
References | Authors | |
0 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Noureddine Aribi | 1 | 0 | 2.37 |
Nadjib Lazaar | 2 | 36 | 12.25 |
Yahia Lebbah | 3 | 115 | 19.34 |
Samir Loudni | 4 | 152 | 21.48 |
mehdi maamar | 5 | 3 | 1.40 |