Title
Lattice Metric Space Application to Grain Defect Detection.
Abstract
We propose a new model for grain defect detection based on the theory of lattice metric space [7]. The lattice metric space (L, d(L)) shows outstanding advantages in representing lattices. Utilizing this advantage, we propose a new algorithm, Lattice clustering algorithm (LCA). After over-segmentation using regularized k-means, the merging stage is built upon the lattice equivalence relation. Since LCA is built upon (L, d(L)), it is robust against missing particles, deficient hexagonal cells, and can handle non-hexagonal lattices without any modification. We present various numerical experiments to validate our method and investigate interesting properties.
Year
DOI
Venue
2019
10.1007/978-3-030-22368-7_30
Lecture Notes in Computer Science
Field
DocType
Volume
Combinatorics,Equivalence relation,Lattice (order),Hexagonal crystal system,Metric space,Cluster analysis,Merge (version control),Physics
Conference
11603
ISSN
Citations 
PageRank 
0302-9743
0
0.34
References 
Authors
0
2
Name
Order
Citations
PageRank
Yuchen He101.01
Sung Ha Kang243029.39