Paper Info
Title
Reconstruction Of Partially Sampled EELS Images
Abstract
Electron microscopy has shown to be a very powerful tool to deeply analyze the chemical composition at various scales. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the radiation damage induced by the electron beam. Particularly, electron energy loss spectroscopy (EELS) which acquires a spectrum for each spatial position requires high beam intensity. Scanning transmission electron microscopes (STEM) sequentially acquire data cubes by scanning the electron probe over the sample and record a spectrum for each spatial position. Recent works developed new acquisition procedures, which allow for partial acquisition schemes following a predetermined scan pattern. A reconstruction of the full data cube is conducted as a post-processing step. A multi-band image reconstruction procedure which exploits the spectral structure and the spatial smoothness of STEM-EELS images is explained here. The performance of the proposed scheme is illustrated thanks to experiments conducted on a realistic phantom dataset as well as real EELS spectrum-image.
Year
DOI
Venue
2018
10.1109/WHISPERS.2018.8747104
2018 9th Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS)
Keywords
Field
DocType
Electron Energy Loss Spectroscopy EELS,Scanning Transmission Electron Microscope STEM,spectrum-image,multi-band imaging,image reconstruction,partial sampling,inpainting
Iterative reconstruction,Imaging phantom,Optics,Inpainting,Electron microscope,Beam (structure),Electron energy loss spectroscopy,Materials science,Data cube,Electron
Conference
ISSN
ISBN
Citations 
2158-6268
978-1-7281-1582-5
0
PageRank 
References 
Authors
0.34
5
6
Name
Order
Citations
PageRank
Étienne Monier100.68
Thomas Oberlin212814.57
Nathalie Brun300.68
Marcel Tencé400.68
Maria de Frutos500.34
Nicolas Dobigeon62070108.02