Name
Abstract | ||
|---|---|---|
Safety is one of the crucial features of autonomous drive platforms, and semiconductor chips used in these architectures must guarantee functional safety aspects mandated by ISO 26262 standard. To monitor the failures due to field defects, in-system-structural-tests are automatically run during key-on and/or key-off. Upon detection of any permanent defects by the in-system-test (IST) architecture, Drive platform responds to achieve the fail-safe state of the system. In this paper, we present the IST architecture that helps with achieving highest functional safety levels on the NVIDIA Drive platform. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/VTS.2019.8758636 | 2019 IEEE 37th VLSI Test Symposium (VTS) |
Keywords | Field | DocType |
automotive,functional safety,ISO 26262,in-system-test,MBIST,LBIST,ATPG,power,permanent faults | Automatic test pattern generation,Architecture,Computer science,Functional safety,System testing,Real-time computing,Embedded system,Automotive industry | Conference |
ISSN | ISBN | Citations |
1093-0167 | 978-1-7281-1171-1 | 0 |
PageRank | References | Authors |
0.34 | 3 | 10 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Pavan Kumar Datla Jagannadha | 1 | 2 | 1.25 |
| Mahmut Yilmaz | 2 | 189 | 13.84 |
| Milind Sonawane | 3 | 8 | 2.09 |
| Sailendra Chadalavada | 4 | 2 | 0.92 |
| Shantanu Sarangi | 5 | 2 | 1.59 |
| Bonita Bhaskaran | 6 | 6 | 1.89 |
| Shashank Bajpai | 7 | 0 | 0.34 |
| Venkat Abilash Reddy Nerallapally | 8 | 0 | 0.34 |
| Jayesh Pandey | 9 | 0 | 0.34 |
| Sam Jiang | 10 | 0 | 0.34 |