Name
Abstract | ||
|---|---|---|
In recent years, jitter characterization has acquired an ever greater importance for many applications and standard technologies. As a consequence, several measurement approaches have been developed, including different jitter graphical representations, decomposition methods and measurement instruments that can be used singularly or together. Unfortunately, choosing the approach most suited to the particular need and / or specific application can be very hard. To help engineers dealing with the graph choice, this paper provides an overview of jitter graphical representations, highlighting their limitations and advantages. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/MIM.2019.8782200 | IEEE Instrumentation & Measurement Magazine |
Field | DocType | Volume |
Measuring instrument,Histogram,Graph,Phase noise,Electronic engineering,Engineering,Jitter | Journal | 22 |
Issue | ISSN | Citations |
4 | 1094-6969 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Eulalia Balestrieri | 1 | 17 | 8.97 |
| Francesco Picariello | 2 | 2 | 7.51 |
| Sergio Rapuano | 3 | 186 | 31.76 |
| Ioan Tudosa | 4 | 8 | 6.95 |