Title
Stochastic Class-Based Hard Example Mining For Deep Metric Learning
Abstract
Performance of deep metric learning depends heavily on the capability of mining hard negative examples during training. However many metric learning algorithms often require intractable computational cost due to frequent feature computations and nearest neighbor searches in a large-scale dataset.As a result, existing approaches often suffer from trade-off between training speed and prediction accuracy. To alleviate this limitation, we propose a stochastic hard negative mining method. Our key idea is to adopt class signatures that keep track of feature embedding online with minor additional cost during training,and identify hard negative example candidates using the signatures. Given an anchor instance, our algorithm first selects a few hard negative classes based on the class-to-sample distances and then performs a refined search in an instance-level only from the selected classes. As most of the classes are discarded at the first step, it is much more efficient than exhaustive search while effectively mining a large number of hard examples. Our experiment shows that the proposed technique improves image retrieval accuracy substantially; it achieves the state-of-the-art performance on the several standard benchmark datasets.
Year
DOI
Venue
2019
10.1109/CVPR.2019.00742
2019 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2019)
Field
DocType
ISSN
Pattern recognition,Computer science,Artificial intelligence
Conference
1063-6919
Citations 
PageRank 
References 
3
0.38
0
Authors
4
Name
Order
Citations
PageRank
Yumin Suh1494.38
Bohyung Han2220394.45
Wonsik Kim340.73
Kyoung Mu Lee43228153.84