Title
Modeling The Error Of Factory-Calibrated Continuous Glucose Monitoring Sensors: Application To Dexcom G6 Sensor Data
Abstract
Minimally-invasive continuous glucose monitoring (CCM) sensors are used in diabetes therapy to monitor interstitial glucose (IC) concentration almost continuously (e.g. every 5 min) and detect/predict dangerous hypo/hyperglycemic episodes. When compared with frequent blood glucose (BC) concentration references, CCM measurements are unavoidably affected by error. Models of the CCM error can be important in several applications, e.g. for testing in simulation the safety and effectiveness of CCM-based artificial pancreas algorithms. In this work, we model the error of the Dexcom C6, a CCM sensor that recently entered the market and does not require in vivo calibrations. The dataset includes CCM and BC data collected in 11 subjects wearing two Dexcom C6 sensors in parallel. The model is derived applying a methodology to dissect and model 3 main CCM error components: BC-to-IC kinetics, calibration error and measurement noise. An aspect of novelty of the method is its capability of handling factory-calibrated CCM sensor data. Results of model identification show that the time-variability of sensor calibration error during the sensor lifetime (10 days) can be well represented by a regression model with time-variant parameters described by 2nd-order polynomials in time.
Year
DOI
Venue
2019
10.1109/EMBC.2019.8856790
2019 41ST ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY (EMBC)
Field
DocType
Volume
Computer vision,Artificial pancreas,Data modeling,Continuous glucose monitoring,Noise measurement,Computer science,Measurement uncertainty,Real-time computing,Artificial intelligence,Calibration Error,System identification,Calibration
Conference
2019
ISSN
Citations 
PageRank 
1557-170X
0
0.34
References 
Authors
0
4
Name
Order
Citations
PageRank
Martina Vettoretti173.39
Simone Del Favero26715.81
Giovanni Sparacino327652.52
Andrea Facchinetti415228.83