Title
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Abstract
Stochastic computing (SC) has attractive characteristics, compared with deterministic (or general binary) computing, such as smaller area of the implemented circuits, higher fault tolerance and so on. This study focuses on the transient fault tolerance of SC circuits with linear finite state machines (linear FSMs). To improve the transient fault tolerability of linear-FSM-based SC circuits, we propose a scheme for encoding the states of the FSM with stochastic numbers (SNs). Moreover, we discuss approximating state transition of the FSM so as to reduce the area overhead. The proposed SC circuits are modeled as Markov processes to clarify their behaviors when any transient fault occurs. Experimental results clarify the improvement in the fault tolerability of the SC circuits based on the proposed state encoding with SNs.
Year
DOI
Venue
2019
10.1109/DFT.2019.8875383
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Keywords
Field
DocType
state encoding,stochastic numbers,transient fault tolerant linear finite state machines,stochastic computing,transient fault tolerance,linear FSMs,transient fault tolerability,linear-FSM-based SC circuits,state transition,Markov processes
Topology,Markov process,Computer science,Finite-state machine,Electronic engineering,Fault tolerance,Transient analysis,Electronic circuit,Stochastic computing,Binary number,Encoding (memory)
Conference
ISSN
ISBN
Citations 
1550-5774
978-1-7281-2261-8
0
PageRank 
References 
Authors
0.34
7
4
Name
Order
Citations
PageRank
Hideyuki Ichihara19618.92
Yuki Maeda271.74
Tsuyoshi Iwagaki300.34
Tomoo Inoue435247.23