Abstract | ||
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With the growing cost of powering and cooling, the Dynamic Voltage Frequency Scaling (DVFS) technique has been adopted in many mobiles and embedded devices nowadays. However, attackers are capable of maliciously manipulating the DVFS to threaten application programs including the security related ones. This paper first proposes a test method to test the vulnerabilities of CPU instructions under the DVFS attack. The test program feature, the testability of CPU instructions, and the Test Program Generation Algorithm (TPGA) are proposed. It is applied to an arm CPU in a mobile phone. Typical instructions are tested, and some are found vulnerable. Then, based on the test result, a method for code optimization by instruction substitution is proposed. The application program using vulnerable instructions are then attacked and optimized to prove the effectiveness of the proposed methods. |
Year | DOI | Venue |
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2019 | 10.1109/ITC-Asia.2019.00022 | 2019 IEEE International Test Conference in Asia (ITC-Asia) |
Keywords | Field | DocType |
instruction vulnerability,DVFS attack,processor | Program optimization,Testability,Dynamic voltage frequency scaling,ARM architecture,Test method,Computer science,Real-time computing,Mobile phone,Test program,Embedded system,Vulnerability | Conference |
ISBN | Citations | PageRank |
978-1-7281-4719-2 | 0 | 0.34 |
References | Authors | |
9 | 8 |
Name | Order | Citations | PageRank |
---|---|---|---|
Junying Huang | 1 | 0 | 2.03 |
Jing Ye | 2 | 45 | 12.80 |
Xiaochun Ye | 3 | 125 | 28.41 |
Da Wang | 4 | 0 | 1.35 |
FAN Dong-Rui | 5 | 222 | 38.18 |
Huawei Li | 6 | 417 | 56.32 |
Xinrong Li | 7 | 1266 | 157.76 |
Zhimin Zhang | 8 | 54 | 11.10 |