Title
Better And Faster: Exponential Loss For Image Patch Matching
Abstract
Recent studies on image patch matching are paying more attention on hard sample learning, because easy samples do not contribute much to the network optimization. They have proposed various hard negative sample mining strategies, but very few addressed this problem from the perspective of loss functions. Our research shows that the conventional Siamese and triplet losses treat all samples linearly, thus make the training time consuming. Instead, we propose the exponential Siamese and triplet losses, which can naturally focus more on hard samples and put less emphasis on easy ones, meanwhile, speed up the optimization. To assist the exponential losses, we introduce the hard positive sample mining to further enhance the effectiveness. The extensive experiments demonstrate our proposal improves both metric and descriptor learning on several well accepted benchmarks, and outperforms the state-of-the-arts on the UBC dataset. Moreover, it also shows a better generalizability on cross-spectral image matching and image retrieval tasks.
Year
DOI
Venue
2019
10.1109/ICCV.2019.00491
2019 IEEE/CVF INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV 2019)
Field
DocType
ISSN
Computer vision,Exponential function,Pattern recognition,Computer science,Artificial intelligence
Conference
1550-5499
Citations 
PageRank 
References 
1
0.34
0
Authors
7
Name
Order
Citations
PageRank
Shuang Wang151.06
Yanfeng Li220.69
Xuefeng Liang321.71
Dou Quan423.06
Bowu Yang511.02
Shaowei Wei621.03
Licheng Jiao75698475.84