Title
Investigation of NbOx-based volatile switching device with self-rectifying characteristics
Abstract
The niobium oxide based nonlinear devices were fabricated and analyzed. The electrical tests present good control over device-to-device variation and stable endurance more than 106. The conduction mechanism was comprehensively discussed. The low-voltage region relates to SCLC, while Schottky and F-N tunneling are responsible for negative and positive high-voltage region respectively. Consequently, the volatile switching may originate from the capture and release of electrons by traps in SCLC mechanism, and this relaxation phenomenon is evaluated quantitatively.
Year
DOI
Venue
2019
10.1007/s11432-019-9894-0
Science China Information Sciences
DocType
Volume
Issue
Journal
62
12
ISSN
Citations 
PageRank 
1674-733X
0
0.34
References 
Authors
0
8
Name
Order
Citations
PageRank
Yichen Fang102.03
Zongwei Wang211.38
Caidie Cheng311.37
Zhizhen Yu402.03
Teng Zhang544.24
Yuchao Yang644.80
Yimao Cai797.26
Ru Huang818848.74