Name
Abstract | ||
|---|---|---|
Power devices have an increasing relevance in many applications, including some safety-critical ones. In the latter case, the effectiveness of the test performed at the end of the manufacturing, when the device is already mounted on the final board, is crucial. Unfortunately, assessing such effectiveness is not trivial, since it requires defining a metric that could be measured in an objective manner. Following a trend that is common to the whole world of analog components, in a previous paper we proposed a fault model based on the availability of the electrical model of the power device. Using this fault model, the test engineer can assess and possibly improve the quality of the developed test solution, and optimize the overall test plan so that a given fault coverage is achieved with minimum cost. The proposed fault requires the availability of the electrical model of the power device. In this paper we adopt this approach on a case of study using a power device, and analyze the effectiveness provided by a set of functional tests and an in-circuit one. Results are reported and discussed, showing the advantages and limitations of the approach. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/DCIS201949030.2019.8959845 | 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) |
Keywords | Field | DocType |
Power electronics,Functionally test,End-of-manufactory test,PCB test,Safety-Critical applications | Test plan,Fault coverage,Electrical model,Power semiconductor device,Computer science,Test engineer,Power electronics,Fault model,Reliability engineering,Test solution | Conference |
ISSN | ISBN | Citations |
2471-6170 | 978-1-7281-5459-6 | 0 |
PageRank | References | Authors |
0.34 | 4 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Davide Piumatti | 1 | 5 | 3.00 |
| Stefano Borlo | 2 | 0 | 0.34 |
| Fabio Mandrile | 3 | 0 | 0.34 |
| Matteo Sonza Reorda | 4 | 1250 | 136.66 |
| r bojoi | 5 | 4 | 4.69 |