Name
Abstract | ||
|---|---|---|
IC designs are expanding from consumer application centric (mobile) into automotive, server and infrastructure market which require longer lifetime. IC designers must contend with advanced circuit complexity with stringent requirements on performance, low power, design robustness for safety and reliability such as electromigration and device aging. In this paper, we will discuss the latest Synopsys' analog mixed-signal simulation (AMS) solution on simulation-based reliability design and verification targeted for robust design. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/ASICON47005.2019.8983649 | 2019 IEEE 13th International Conference on ASIC (ASICON) |
Keywords | Field | DocType |
advanced reliability-aware verification,robust circuit design,IC designs,consumer application centric,infrastructure market,circuit complexity,electromigration,device aging,simulation-based reliability design,Synopsys analog mixed-signal simulation | Robust design,Circuit complexity,Computer science,Circuit design,Electronic engineering,Robustness (computer science),Electromigration,Reliability design,Reliability engineering,Automotive industry | Conference |
ISSN | ISBN | Citations |
2162-7541 | 978-1-7281-0736-3 | 0 |
PageRank | References | Authors |
0.34 | 0 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Joddy Wang | 1 | 0 | 0.34 |
| Frank Lee | 2 | 0 | 0.34 |