Title
The Impact of Temperature and Switching Rate on Dynamic Transients of High-Voltage Silicon and 4H-SiC NPN BJTs: A Technology Evaluation
Abstract
This paper reports the application of silicon bipolar junction transistor (BJT) modeling techniques to the modeling of dynamic behavior of high-voltage 4H-SiC BJTs, and the experimental validation thereof. High-voltage silicon BJTs are impractical due to their low current gain that requires a bulky base driver. Emergence of high-voltage 4H-SiC vertical NPN BJTs with a tenfold higher gain enables the application of efficient drivers, with ratings close to those of IGBTs. This paper demonstrates the advantages offered by 4H-SiC BJTs by means of wide-scale measurements at 800 V and 10 A in a range of temperatures up to 175 °C and adjusted base driver switching rates. This paper shows that the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">off</sc> storage delay in the SiC BJT is two orders of magnitude lower than that of the silicon device. It also shows that the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</sc> switching transients of SiC device are by an order of magnitude and the turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">off</sc> transients are by two orders of magnitude faster than that of its silicon counterpart, resulting in a tenfold reduction of the switching energy. It also demonstrates the temperature dependence of switching transients of the silicon BJT, and the relative temperature-invariance of the SiC device's performance. This paper concludes with validation of the transient models for the 4H-SiC NPN BJT, showing that the model is sufficiently accurate for transient switching and loss calculations.
Year
DOI
Venue
2020
10.1109/TIE.2019.2922918
IEEE Transactions on Industrial Electronics
Keywords
Field
DocType
Silicon carbide,Silicon,Transient analysis,High-voltage techniques,Temperature measurement,Temperature dependence,Switches
Control theory,Bipolar junction transistor,Engineering,High voltage,Optoelectronics,Silicon
Journal
Volume
Issue
ISSN
67
6
0278-0046
Citations 
PageRank 
References 
0
0.34
0
Authors
4
Name
Order
Citations
PageRank
Saeed Jahdi100.34
Mohammad Hedayati200.34
Bernard H. Stark3153.80
Phil H. Mellor400.34