Title | ||
---|---|---|
多 层缺陷关联效应对软件可靠性增长过程的影响 (Impacts of Correlation Effects among Multi-layer Faults on Software Reliability Growth Processes). |
Year | DOI | Venue |
---|---|---|
2018 | 10.11896/j.issn.1002-137X.2018.02.042 | 计算机科学 |
DocType | Volume | Issue |
Journal | 45 | 2 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Zelong Yi | 1 | 0 | 0.68 |
Yumei Wen | 2 | 11 | 7.32 |
Yanmin Lin | 3 | 0 | 0.34 |
Weiting Chen | 4 | 0 | 2.03 |
Guanyu Lv | 5 | 0 | 0.34 |