Name
Abstract | ||
|---|---|---|
The temperature coefficient of resistance (TCR) of thin metal lines is often used for applications in thermometry [1], phase change [2], or even thermal accelerometers [3]. However, the TCR of metals drops sharply in films thinner than ~10 nm due to strong surface scattering, preventing their use as ultra-fast thermal sensors, which require reduced thermal mass. In contrast, here we demonstrate for the first time that atomically-thin two-dimensional (2D) materials maintain large TCRs ( >0.5%) even at sub-nm thickness. Fundamentally, these experiments illustrate that transport in high-quality 2D materials remains phonon-limited, unlike ultra-thin metals. From an application standpoint, high TCR in atomically-thin films is expected to enable fast thermal sensors. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/DRC46940.2019.9046401 | 2019 Device Research Conference (DRC) |
Keywords | DocType | ISSN |
atomically-thin 2D materials,atomically-thin two-dimensional materials,thermometry,atomically-thin film 2D devices,ultrathin metal drops,ultrafast thermal sensors,high TCR,high-quality 2D materials,thermal mass reduction,surface scattering,thermal accelerometers,metal lines,large temperature coefficient of resistance | Conference | 1548-3770 |
ISBN | Citations | PageRank |
978-1-7281-2113-0 | 0 | 0.34 |
References | Authors | |
0 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Asir Intisar Khan | 1 | 0 | 0.34 |
| Kevin Brenner | 2 | 0 | 0.68 |
| Kirby K. H. Smithe | 3 | 0 | 0.34 |
| Michal J. Mleczko | 4 | 0 | 0.68 |
| Eric Pop | 5 | 50 | 12.07 |