Title
A Systematic Study on Mitigating Parameter Variation in MOSFETs.
Abstract
The VLSI design was horse-powered mainly by the elegant and simple MOSFET (Metal Oxide-Semiconductor Field Effect Transistor) which amazingly yielded to the designer's scaling wishes; Though its operation is governed by umpteen kinds of parameters which depends on the physical dimensions, many process-related aspects as well as the ambient features of the device. The dependence of these parameters on the above-mentioned factors make them vulnerable to variation. Thus, the effect of parameter variations can be summed up as the reduction in wafer yield and hence profit. Over the years, designers were diligently researching and coming up with solutions to combat the menace of parameter variation according to the extent of variation and stringency of requirement. The solution approaches range from not-so-sophisticated marketing techniques such as frequency-binning to the employment of sophisticated techniques such as body biasing to automatically compensate the parameter variations. This paper aims to probe various reasons and impacts of the parameter variations in MOSFETs and to describe some of the techniques to mitigate the parameter variations in a systematic manner.
Year
DOI
Venue
2015
10.1007/978-981-10-0451-3_11
PROCEEDINGS OF FIFTH INTERNATIONAL CONFERENCE ON SOFT COMPUTING FOR PROBLEM SOLVING (SOCPROS 2015), VOL 2
Keywords
DocType
Volume
Adaptive body bias,Body bias generator,Process control monitoring,Voltage controlled oscillator
Conference
437
ISSN
Citations 
PageRank 
2194-5357
0
0.34
References 
Authors
0
5
Name
Order
Citations
PageRank
Prashant Kumar100.34
Neeraj Gupta200.34
Rashmi Gupta300.34
Janak Kumar B. Patel400.34
Ashutosh Kumar Gupta5114.12