Name
Title | ||
|---|---|---|
Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments |
Abstract | ||
|---|---|---|
In harsh radiation environments, nanoscale CMOS latches have become more and more vulnerable to triple-node upsets (TNUs). This paper first proposes a latch design that can self-recover from any possible TNU for aerospace applications in the 16-nm CMOS technology. The proposed latch is mainly constructed from seven mutually feeding-back soft-error-interceptive modules (SIMs), any of which consists of two three-input C-elements and one two-input C-element. Due to the mutual feedback mechanism of SIMs and the dual-level soft-error interception of each SIM, the latch can self-recover from any possible TNU. Simulation results demonstrate the TNU self-recoverability from any key TNU for the proposed latch using redundant silicon area. Furthermore, using a high-speed path, the proposed latch saves about 95.45% transmission delay and 86.97% delay-power-area product, compared with the state-of-the-art TNU-tolerant latch that cannot provide complete TNU self-recoverability at all. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/TAES.2019.2925448 | IEEE Transactions on Aerospace and Electronic Systems |
Keywords | DocType | Volume |
Harsh radiation,radiation-hardening-by-design,self-recoverability,soft error,triple-node upset (TNU) | Journal | 56 |
Issue | ISSN | Citations |
2 | 0018-9251 | 3 |
PageRank | References | Authors |
0.48 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Aibin Yan | 1 | 29 | 6.78 |
| Xiangfeng Feng | 2 | 3 | 1.16 |
| Yuanjie Hu | 3 | 7 | 2.95 |
| Chaoping Lai | 4 | 9 | 1.27 |
| Jie Cui | 5 | 3 | 1.83 |
| Zhili Chen | 6 | 3 | 0.82 |
| Kohei Miyase | 7 | 562 | 38.71 |
| Xiaoqing Wen | 8 | 790 | 77.12 |