Title | ||
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28.3 A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. |
Abstract | ||
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CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (\u003e70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption. |
Year | DOI | Venue |
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2020 | 10.1109/ISSCC19947.2020.9062919 | ISSCC |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
0 | 6 |
Name | Order | Citations | PageRank |
---|---|---|---|
Sangwoo Lee | 1 | 53 | 15.00 |
Jinwoong Jeong | 2 | 0 | 0.68 |
Taewoong Kim | 3 | 0 | 0.34 |
Chanmin Park | 4 | 0 | 0.68 |
Tae-Woo Kim | 5 | 10 | 8.20 |
Youngcheol Chae | 6 | 349 | 53.43 |