Title
28.3 A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs.
Abstract
CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (\u003e70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption.
Year
DOI
Venue
2020
10.1109/ISSCC19947.2020.9062919
ISSCC
DocType
Citations 
PageRank 
Conference
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Sangwoo Lee15315.00
Jinwoong Jeong200.68
Taewoong Kim300.34
Chanmin Park400.68
Tae-Woo Kim5108.20
Youngcheol Chae634953.43