Title
Ultra-Thin III-V Photodetectors Epitaxially Integrated on Si with Bandwidth Exceeding 25 GHz
Abstract
We demonstrate the first local monolithic integration of high-speed III-V p-i-n photodetectors on Si by in-plane epitaxy. Ultra-low capacitance permits data reception at 32Gbps. The approach allows close integration to electronics enabling future receiverless communication.
Year
DOI
Venue
2020
10.1364/OFC.2020.M3D.3
OFC
DocType
Citations 
PageRank 
Conference
0
0.34
References 
Authors
0
8
Name
Order
Citations
PageRank
Svenja Mauthe100.34
Yannick Baumgartner201.69
S. Sant300.68
Qian Ding400.34
Marilyne Sousa501.35
Czornomaz, L.603.38
A. Schenk764.24
Moselund, K.800.68