Name
Abstract | ||
|---|---|---|
Motivated by an accelerated degradation test (ADT) on the power gain of microwave power amplifiers, in this article we propose a model-ranking approach for the estimation of some important reliability characteristics. Different degradation models and statistical lifetime distributions are applied to model the data obtained from the ADT. We study the effect of model misspecification in estimating t... |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/TR.2020.2976786 | IEEE Transactions on Reliability |
Keywords | DocType | Volume |
Degradation,Stress,Microwave circuits,Microwave integrated circuits,Data models,Integrated circuit modeling | Journal | 69 |
Issue | ISSN | Citations |
2 | 0018-9529 | 0 |
PageRank | References | Authors |
0.34 | 0 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ling Li | 1 | 0 | 0.34 |
| Hon Keung Tony Ng | 2 | 40 | 13.47 |
| Ali H. Algarni | 3 | 1 | 2.39 |
| Abdullah M. Almarashi | 4 | 0 | 4.73 |
| Zaher A. Abo-Eleneen | 5 | 0 | 0.34 |