Title
Adaptive Scan for Atomic Force Microscopy Based on Online Optimization: Theory and Experiment.
Abstract
A major challenge in atomic force microscopy is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as well as a safe tip-sample contact force. This usually results in a conservative scan rate for samples that have a large variation in aspect ratio and/or for scan patte...
Year
DOI
Venue
2020
10.1109/TCST.2019.2895798
IEEE Transactions on Control Systems Technology
Keywords
DocType
Volume
Trajectory,Imaging,Force,Surfaces,Actuators,Measurement,Bandwidth
Journal
28
Issue
ISSN
Citations 
3
1063-6536
0
PageRank 
References 
Authors
0.34
9
5
Name
Order
Citations
PageRank
Kaixiang Wang100.34
Michael G. Ruppert253.37
Chris Manzie331846.66
Dragan Nesic42995293.47
Yuen Kuan Yong56611.78