Name
Abstract | ||
|---|---|---|
Robust reliability of industrial grade (Tj: -40~125°C) was successfully demonstrated. The reliability items such as HTOL, retention and endurance test showed negligible fail bit count changes with ECC off mode even after accelerated stress conditions for 10yr user life time and come to zero with ECC on mode. The magnetic field stress test was intensively studied and from this research, the range of magnetic field immunity for user condition was understood which enhanced the quality of mass production of our STT-MRAM. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/IRPS45951.2020.9129178 | 2020 IEEE International Reliability Physics Symposium (IRPS) |
Keywords | DocType | ISSN |
STT-MRAM,Reliability,Magnetic immunity,Radiation | Conference | 1541-7026 |
ISBN | Citations | PageRank |
978-1-7281-3199-3 | 0 | 0.34 |
References | Authors | |
0 | 31 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ji Young Kim | 1 | 38 | 9.66 |
| H. Goo | 2 | 0 | 0.34 |
| Jongsik Lim | 3 | 3 | 3.69 |
| T. Y. Jeong | 4 | 0 | 0.34 |
| T. Uemura | 5 | 0 | 0.34 |
| G. R. Kim | 6 | 0 | 0.34 |
| B. I. Seo | 7 | 0 | 0.34 |
| Seung Woo Lee | 8 | 67 | 21.56 |
| G. Park | 9 | 0 | 0.34 |
| J. Jo | 10 | 0 | 0.34 |
| S. I. Han | 11 | 0 | 0.34 |
| C. K. Lee | 12 | 97 | 13.28 |
| Jin-Ho Lee | 13 | 26 | 7.29 |
| S.H. Hwang | 14 | 0 | 1.01 |
| Dae Sung Lee | 15 | 43 | 9.73 |
| Seongmin Pyo | 16 | 2 | 3.76 |
| H. T. Jung | 17 | 0 | 0.34 |
| S. H. Sun | 18 | 2 | 0.73 |
| S. Noh | 19 | 0 | 0.34 |
| Kyung-Suk Suh | 20 | 0 | 1.01 |
| S. Y. Yoon | 21 | 0 | 0.34 |
| H. Nam | 22 | 0 | 0.34 |
| H. Hwang | 23 | 0 | 0.34 |
| H. Jiang | 24 | 0 | 0.34 |
| J. W. Kim | 25 | 0 | 0.34 |
| D. Kwon | 26 | 0 | 0.34 |
| Y. J. Song | 27 | 0 | 0.34 |
| K. H. Koh | 28 | 0 | 0.34 |
| H. S. Rhee | 29 | 0 | 0.34 |
| S. Pae | 30 | 0 | 0.34 |
| E. Lee | 31 | 0 | 0.34 |