Name
Abstract | ||
|---|---|---|
This paper introduces a standards-based framework which enables two types of test re-use: direct re-use of test patterns written for low-level components of a system, and access by high-level tests of test features embedded within the low-level components. The underlying mechanism for both is the encapsulation, retargeting, and transformation of test procedures through successive layers of hardware interfaces, as codified in two standards being developed by IEEE Working Groups (P1687.1 and P2654). Examples demonstrate the steps in the process and illustrate both the challenges and opportunities of this approach. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/ETS48528.2020.9131595 | 2020 IEEE European Test Symposium (ETS) |
Keywords | DocType | ISSN |
system test,embedded test,retargeting,IEEE 1687,IEEE P1687.1,IEEE P2654,IJTAG,SJTAG,STAM | Conference | 1530-1877 |
ISBN | Citations | PageRank |
978-1-7281-4312-5 | 0 | 0.34 |
References | Authors | |
0 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michele Portolan | 1 | 11 | 5.50 |
| Jeff Rearick | 2 | 304 | 25.63 |
| Martin Keim | 3 | 0 | 0.34 |