Title
Dynamic Authentication-Based Secure Access to Test Infrastructure
Abstract
The complexity of modern Systems-on-Chips is steadily increasing, which poses hard challenges for testing. In order to be able to face those challenges, several standards have been proposed through history, such as the latest IEEE 1687 on Reconfigurable Scan Networks (RSNs), which allows dynamic configuration of the test infrastructure for an easier access to embedded instruments and data. This ease of access, however, may constitute a serious threat from the point of view of security, as it may be used by an attacker as an entry point to the internal state of the circuit, especially if the test infrastructure is reused for life-time testing. Some approaches exist to protect the access, but their performances and security levels are limited by the legacy view of test as a static process. In this paper, we propose an innovative solution that exploits the dynamic nature of the IEEE 1687 standard to obtain an Authentication-based Secure Access framework able to provide a trusted and personalized interface to the test infrastructure depending on user-defined security levels.
Year
DOI
Venue
2020
10.1109/ETS48528.2020.9131571
2020 IEEE European Test Symposium (ETS)
Keywords
DocType
ISSN
Reconfigurable Scan Networks,Secure Access,Authentication,Automated Test Environments
Conference
1530-1877
ISBN
Citations 
PageRank 
978-1-7281-4312-5
2
0.39
References 
Authors
0
4
Name
Order
Citations
PageRank
Michele Portolan1115.50
Vincent Reynaud220.39
Paolo Maistri324520.35
regis leveugle437032.01