Name
Abstract | ||
|---|---|---|
A novel method to efficiently and accurately prognosticate the pattern count at different input compression ratios with the Embedded Deterministic Test (EDT) compression technology is proposed. With this method the total ATPG run time can be significantly reduced compared to the currently used trial-and-error method. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/ETS48528.2020.9131586 | 2020 IEEE European Test Symposium (ETS) |
DocType | ISSN | ISBN |
Conference | 1530-1877 | 978-1-7281-4312-5 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
8 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Fong-Jyun Tsai | 1 | 0 | 0.34 |
| Chong-Siao Ye | 2 | 4 | 1.90 |
| Yu Huang | 3 | 5 | 2.59 |
| Kuen-jong Lee | 4 | 606 | 65.60 |
| Wu-tung Cheng | 5 | 1350 | 121.45 |
| Sudhakar M. Reddy | 6 | 5747 | 699.51 |
| Mark Kassab | 7 | 654 | 48.74 |
| Janusz Rajski | 8 | 2460 | 201.28 |