Name
Abstract | ||
|---|---|---|
The liver cancer is one of the most common fatal diseases worldwide, and its early detection through medical imaging is a major contributor to the reduction in mortality from certain cancer. This paves the way to work on diagnosing liver diseases effectively. An accurate diagnosis of liver disease in CT image requires an efficient description of textures and classification methods. This paper performs comparative analysis on proposed texture feature descriptor with the different existing texture features with various classifiers to classify six types of diffused and focal liver diseases. The classification of liver diseases is done in two stages. In first stage, features like segmentation based fractal texture analysis, counting label occurrence matrix, local configuration pattern, eXtended center-symmetric local binary pattern and the proposed local symmetric tetra pattern are used for extracting information from the CT liver structure and classifiers like support vector machine, k-nearest neighbor, and naive Bayes are used for classifying the pathologic liver. When pathologic conditions are detected, the best feature descriptors and classifiers are used to classify the results into any of six exclusive pathologic liver diseases, in second stage. The experiments are carried out in medically validated liver datasets containing normal and six-disease category of liver. The first experiment is analyzed using sensitivity, specificity, and accuracy. The second experiment is evaluated using precision, recall, BCR, and F-measure. The results demonstrate that the local symmetric tetra pattern with k-nearest neighbor classifier culminates in a state-of-the-art performance for diagnosing liver diseases. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1142/S0219467820500151 | INTERNATIONAL JOURNAL OF IMAGE AND GRAPHICS |
Keywords | DocType | Volume |
Liver disease diagnosis, feature extraction, segmentation based fractal texture analysis, counting label occurrence matrix, local configuration pattern, eXtended center-symmetric local binary pattern and local symmetric tetra pattern, classification, support vector machine, k-nearest neighbor, naive Bayes | Journal | 20 |
Issue | ISSN | Citations |
2 | 0219-4678 | 0 |
PageRank | References | Authors |
0.34 | 0 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Sinduja | 1 | 0 | 0.68 |
| A. Suruliandi | 2 | 7 | 5.50 |
| S. P. Raja | 3 | 12 | 6.67 |