Name
Abstract | ||
|---|---|---|
Test-pattern programs are for testing DRAM memory chips. They run on a special embedded system called automated test equipment (ATE). Each ATE manufacturer provides its own programming language, which is mostly low level, thus accessing the registers in the ATE directly. The register structure of each ATE is quite different and highly irregular. Since DRAM chipmakers are often equipped with diverse ATEs from different manufacturers, they employ automatic translation of a program developed for one ATE to a program for different ATEs. This raises an irregular register allocation problem during translation. This article proposes a solution based on partitioned Boolean quadratic programming (PBQP). PBQP has been used for a number of compiler optimizations, including paired register allocation, which our ATE register allocation also requires. Moreover, the interleaved processing in ATE incurs complex register constraints, which we could also formulate elegantly with PBQP. The original PBQP solver is not quite appropriate to use, though, since ATE register allocation does not allow spills, so we devised a more elaborate PBQP solver that trades off the allocation time and allocation search space, to find a solution in a reasonable amount of time. Our experimental results with product-level pattern programs show that the proposed register allocator successfully finds valid solutions in all cases, in the order of tenths of seconds.
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Year | DOI | Venue |
|---|---|---|
2021 | 10.1145/3427378 | ACM Transactions on Architecture and Code Optimization |
Keywords | DocType | Volume |
Irregular register allocation,automated test equipment,memory testing,partitioned Boolean quadratic programming,test-pattern programs | Journal | 18 |
Issue | ISSN | Citations |
1 | 1544-3566 | 0 |
PageRank | References | Authors |
0.34 | 0 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Minsu Kim | 1 | 0 | 1.01 |
| Jeong-Keun Park | 2 | 0 | 0.68 |
| Soo-Mook Moon | 3 | 623 | 87.96 |