Name
Title | ||
|---|---|---|
A General Transfer Framework based on Industrial Process Fault Diagnosis under Small Samples |
Abstract | ||
|---|---|---|
The lack of fault samples is a challenging issue for fault diagnosis in the industrial process. It is difficult for conventional fault diagnosis methods to achieve satisfactory results under small samples. This article proposes a general transfer framework with evolutionary capability to address the above issue. First, a general transfer framework is proposed, in which the transfer learning strate... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/TII.2020.3036159 | IEEE Transactions on Industrial Informatics |
Keywords | DocType | Volume |
Fault diagnosis,Correlation,Employee welfare,Training,Libraries,Feature extraction,Microwave integrated circuits | Journal | 17 |
Issue | ISSN | Citations |
9 | 1551-3203 | 2 |
PageRank | References | Authors |
0.37 | 0 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jinhai Liu | 1 | 13 | 5.08 |
| Yifu Ren | 2 | 2 | 1.05 |