Paper Info
Title
Needing measurements and instrumentation within the nanotechnology world: IEEE IMS TC-34 experience
Abstract
Nanotechnology is, first of all, an issue regarding dimensional aspects that have an impact on all the other considerations. Depending on the interest area, the impact of nanotechnology is observed in design, fabrication process, and utilization. To cope with certification procedures, for instance, and their performance, measurements and instrumentation are key points of this complex mosaic. The IEEE Instrumentation and Measurement Society (IMS) developed a technical committee to strongly deal with nanotechnology in instrumentation and measurements called TC-34. Its activities are introduced here, along with a description of its spinoff event called NANOfIM which is a conference with an insight into the nanotechnology world. The first NANOfIM was held in 2015 in Lecce (Italy).
Year
DOI
Venue
2020
10.1109/MIM.2020.9257057
IEEE Instrumentation & Measurement Magazine
Keywords
DocType
Volume
fabrication process,certification procedures,IEEE Instrumentation and Measurement Society,nanotechnology world,IEEE IMS TC-34 experience
Journal
23
Issue
ISSN
Citations 
8
1094-6969
0
PageRank 
References 
Authors
0.34
0
1
Name
Order
Citations
PageRank
Aimé Lay-Ekuakille17121.29