Title
A 0.26% BER, 10<sup>28</sup> Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection
Abstract
A 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">28</sup> challenge-response strong-PUF in 14nm CMOS, demonstrates machine learning (ML) attack resistance across 6-million training samples. The 2-stage non-linear cascaded PUF array with adversarial challenge selection limits ML attack accuracy to ~50%. The configurable cross-coupled inverter-based entropy source with stability-aware challenge pruning enables 9.8× higher array density and 0.26% peak BER across 650-850mV and 0-100°C.
Year
DOI
Venue
2020
10.1109/VLSICircuits18222.2020.9162890
2020 IEEE Symposium on VLSI Circuits
Keywords
DocType
ISSN
higher array density,stability-aware challenge pruning,configurable cross-coupled inverter-based entropy source,ML attack accuracy,2-stage nonlinear cascaded PUF array,6-million training samples,machine learning,challenge-response strong-PUF,stability-aware adversarial challenge selection,14nm CMOS,challenge-response machine-learning resistant strong-PUF,0.26% BER,size 14.0 nm,voltage 650.0 mV to 850.0 mV,temperature 0.0 degC to 100.0 degC
Conference
2158-5601
ISBN
Citations 
PageRank 
978-1-7281-9943-6
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Vikram B. Suresh121.73
Raghavan Kumar27312.56
Mark Anders331550.81
Himanshu Kaul400.34
Vivek De53024577.83
Sanu Mathew6503.78