Paper Info
Title
Data-Driven Fast Electrostatics and TDDB Aging Analysis**This work is supported in part by NSF grants under No. CCF-1816361, in part by NSF grant under No. CCF-2007135 and No. OISE-1854276.
Abstract
The following topics are dealt with: learning (artificial intelligence); deep learning (artificial intelligence); electronic design automation; integrated circuit design; electronic engineering computing; power aware computing; optimisation; microprocessor chips; neural nets; VLSI.
Year
DOI
Venue
2020
10.1145/3380446.3430620
2020 ACM/IEEE 2nd Workshop on Machine Learning for CAD (MLCAD)
Keywords
DocType
ISBN
Reliability,TDDB,Lifetime,Machine Learning
Conference
978-1-6654-4603-7
Citations 
PageRank 
References 
0
0.34
0
Authors
4
Name
Order
Citations
PageRank
Shaoyi Peng123.78
Wentian Jin212.37
Liang Chen324742.33
Sheldon X. -D. Tan482993.06