Name
Abstract | ||
|---|---|---|
As the transistor feature size continuously shrinks, design for manufacturability (DFM) has become a crucial concern. Layout pattern classification, which groups geometrically similar layout clips into clusters, has been widely utilized in a variety of DFM applications, such as hotspot library generation, hierarchical data storage, and systematic yield optimization. In this paper, we have proposed a maximum clique based method to obtain the lower bound of the clustering count and have proven that the lower bound is the theoretical optimal solution. To solve the clustering problem, we formulate it as a Set-Covering Problem (SCP) and utilize the result of the maximum clique to help the SCP quickly converge. Compared with the experimental results of the state-of-the-art approaches on ICCAD 2016 Contest benchmarks, our proposed method can achieve optimal solutions for all benchmarks with an approximate minimum run-time. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/ICCD50377.2020.00058 | 2020 IEEE 38th International Conference on Computer Design (ICCD) |
Keywords | DocType | ISSN |
Design for manufacturability,pattern classification,clustering number minimization | Conference | 1063-6404 |
ISBN | Citations | PageRank |
978-1-7281-9711-1 | 0 | 0.34 |
References | Authors | |
7 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xu He | 1 | 22 | 1.77 |
| Yipei Wang | 2 | 0 | 0.34 |
| zhiyong fu | 3 | 53 | 4.04 |
| Yao Wang | 4 | 23 | 12.50 |
| Yang Guo | 5 | 67 | 32.72 |