Name
Abstract | ||
|---|---|---|
In this brief, a comparison between five different DAC realizations is presented for an equivalent multi-MΩ range resistance in a digitizing current sensor, namely resistor, current source, pseudo-resistor, T-network resistor, and switched-capacitor-resistor (SCR). These DACs are needed to realize current input continuous-time sigma-delta modulator (C-CTΣΔM) readouts to sense currents in the pA range. All DAC realizations are discussed concerning disadvantages and advantages and are implemented, laid out, and simulated on transistor level in a 180nm CMOS technology. The comparison is carried out on the area consumption, required circuit overhead, noise performance, inherent anti-aliasing filter (AAF) quality, and two sources of non-idealities (clock jitter and ISI). It is shown that the SCR-DAC - due to its decaying waveform and its inverse proportionality of the equivalent resistance to its capacitor size - shows the best compromise over the other methods and achieves the best performance in the smallest area. |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/TCSII.2020.3007964 | IEEE Transactions on Circuits and Systems II: Express Briefs |
Keywords | DocType | Volume |
Sigma-delta modulation,current measurement,electrochemical impedance spectroscopy,bioimpedance | Journal | 68 |
Issue | ISSN | Citations |
1 | 1549-7747 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mahdi Rajabzadeh | 1 | 2 | 2.41 |
| Matthias Häberle | 2 | 0 | 1.69 |
| Joachim Becker | 3 | 88 | 18.25 |
| Maurits Ortmanns | 4 | 501 | 114.46 |