Title
Novel Fractional-N All Digital Frequency Locked Loop with Robustness for PVT variation
Abstract
This paper describes a novel Fractional-N all digital frequency locked loop (ADFLL) with robustness for PVT variation. The conventional FLL is difficult to achieve the required specification by using the fine CMOS process. Especially, the conventional FLL has some problems such as unexpected operation and long lock time that are caused by PVT variation. To overcome these problems, we propose a new ADFLL which uses dynamic selecting digital filter coefficient. The proposed ADFLL evaluated through the HSPICE simulation using 0.13 μm CMOS process. From simulation results, the proposed ADFLL has robustness for PVT variation, and the lock time is improved up to 57%.
Year
DOI
Venue
2020
10.1109/ISMVL49045.2020.00-12
2020 IEEE 50th International Symposium on Multiple-Valued Logic (ISMVL)
Keywords
DocType
ISSN
All Digital Frequency Locked Loop,Fractional-N,PVT variation,Lock Time
Conference
0195-623X
ISBN
Citations 
PageRank 
978-1-7281-5407-7
0
0.34
References 
Authors
0
9
Name
Order
Citations
PageRank
Ryoichi Miyauchi100.34
Akio Yoshida200.34
Shuya Nakano300.34
Hiroki Tamura47221.29
Koichi Tanno55722.05
Yutaka Fukuchi600.34
Yukio Kawamura700.34
Yuki Kodama800.34
Yuichi Sekiya900.34