Name
Abstract | ||
|---|---|---|
Numerous machine learning (ML), and more recently, deep-learning (DL)-based approaches, have been proposed to tackle scalability issues in electronic design automation, including those in integrated circuit (IC) test. This article examines state-of-the-art DL for IC test and highlights two critical unaddressed challenges. The first challenge involves identifying fit-for-purpose statistical metrics... |
Year | DOI | Venue |
|---|---|---|
2022 | 10.1109/TCAD.2021.3054808 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | DocType | Volume |
Integrated circuits,Integrated circuit modeling,Measurement,Testing,Solid modeling,Robustness,Training | Journal | 41 |
Issue | ISSN | Citations |
1 | 0278-0070 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Animesh Basak Chowdhury | 1 | 0 | 0.34 |
| Benjamin Tan | 2 | 5 | 3.58 |
| Siddharth Garg | 3 | 675 | 55.14 |
| Ramesh Karri | 4 | 2968 | 224.90 |