Title | ||
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A 0.004% resolution & SAT<1.8 μson-chip adaptive anti-aging system using cuckoo intelligence-based algorithm in 65 nm CMOS |
Abstract | ||
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With the rapid growth of computational intelligence techniques, automatic age estimation has achieved efficiency and accuracy that benefited IC aging-mitigation applications. This paper proposes an adaptive anti-aging system scheme that uses an intelligent algorithm to monitor the frequency degradation of digital circuits. An on-chip reliability sensor with voltage controlled oscillator (VCO) architecture achieved the circuit's aging rate, featuring real-time monitoring and tolerance against PVT variations. Cuckoo intelligence-based algorithm with global search strategy could obtain the accuracy data, reduce the number of iterations, and improve use self-adjust efficiency. The loop circuit can be quickly corrected by precise voltage compensation to alleviate performance degradation. The test chip was fabricated in the TSMC 65-nm CMOS technology with a core area of 0.97 mm2. The measurement results show that the resolution is 0.004% at 1.2 V and 27 °C and a self-adjust time (SAT) reaches about 1.8 μs with an operating frequency of 500 MHz, recovering at 10% aging-related degradation. In comparison with other related literatures, the resolution of the proposed method is improved by more than 2.5 times. |
Year | DOI | Venue |
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2021 | 10.1016/j.vlsi.2021.02.003 | Integration |
Keywords | DocType | Volume |
Anti-aging,Adaptive,Cuckoo intelligent algorithm,NBTI,Circuit design | Journal | 78 |
ISSN | Citations | PageRank |
0167-9260 | 0 | 0.34 |
References | Authors | |
0 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Yuejun Zhang | 1 | 0 | 0.34 |
Haiming Zhang | 2 | 0 | 0.34 |
Pengjun Wang | 3 | 62 | 11.93 |
Qiufeng Wu | 4 | 0 | 0.34 |
Gang Li | 5 | 1 | 1.39 |